Datasheet revision, Rev A to Rev B

The one-page Rev A of the fictional NB-532-3-B narrow bandpass filter against its Rev B rewrite, one specification at a time, with the reason for each change.

Revision history

Rev	Date	Description
Superseded	2026-06-12	Initial release: four values and one curve
Current	2026-10-24	Test conditions added to every specification; typical values separated from limits; blocking stated outside CWL ± 12 nm; three curves drawn from code; tolerance notes, test policy, part number key, outline and handling notes added

Rev A lines and their Rev B counterparts

Condition added
Typical split from limit
Range stated
Tolerance note added
Curve added
Section added
Wording changed

Title

Superseded

~~NB-series narrow bandpass filter~~

532 nm

Current

NB-532-3-B, Narrow bandpass filter, 532 nm, 3.0 nm FWHM, 25.0 mm mounted

Wording changedThe title names the part number, the nominal bandwidth and the mount size

Reason. A printout identifies the exact part without the file name.

Center wavelength

Superseded

~~Wavelength~~	~~532 nm~~

Current

Parameter	Conditions	Min	Typ	Max	Unit
Center wavelength, CWL	AOI 0°, 23 °C, unpolarized, collimated 2 mm beam at the clear aperture center	531	532	533	nm

Condition addedAngle, temperature, polarization and beam stated
Typical split from limitOne value became 531 min, 532 typ and 533 max
Tolerance note addedTemperature and polarization notes added
Curve addedCenter wavelength against angle drawn in Figure 2
Wording changedWavelength renamed Center wavelength, CWL

Reason. A single 532 nm does not say whether it is a nominal value or a limit, or at what angle, temperature and polarization it holds.

Tolerance note in Rev B
The 531 to 533 nm limit is for AOI 0° at 23 °C, and temperature adds to it. At +6 pm/K over −20 to +70 °C the specified window is 530.74 to 533.28 nm, and the typical drift is 0.36 nm.

Bandwidth

Superseded

~~Bandwidth~~	~~3 nm~~

Current

Parameter	Conditions	Min	Typ	Max	Unit
Bandwidth, FWHM	AOI 0°, 23 °C	2.6	3.0	3.4	nm
Attenuation at CWL ± 5 nm	AOI 0°, typical curve	–	3	–	OD
Attenuation at CWL ± 12 nm	AOI 0°, typical curve	–	5	–	OD

Condition addedFWHM stated at AOI 0° and 23 °C
Typical split from limit3 nm became 2.6 min, 3.0 typ and 3.4 max
Range statedAttenuation given at two offsets from the center wavelength

Reason. A bandwidth is only comparable at a stated angle. The limits show what a passing unit looks like, and the two attenuation lines describe how steep the skirt is.

Peak transmission

Superseded

~~Transmission~~	~~>85%~~

Current

Parameter	Conditions	Min	Typ	Max	Unit
Peak transmission	at the measured center wavelength λ₀, AOI 0°	85	90	–	%

Condition addedMeasured at the unit's own center wavelength, at AOI 0°
Typical split from limit>85% became a limit of 85 and a typical value of 90
Wording changedTransmission renamed Peak transmission

Reason. The 85 is a limit and the 90 is typical. Measuring at λ₀ judges a unit centered anywhere in the 531 to 533 nm window at its own peak.

Blocking

Superseded

Blocking	~~OD5~~

Current

Parameter	Conditions	Min	Typ	Max	Unit
Blocking	400 to 1100 nm, outside CWL ± 12 nm, AOI 0°	5	6	–	OD
Blocking test limit	test dynamic range; higher readings reported as > limit	–	–	6.5	OD
Rear surface reflectance	broadband AR coating, average 400 to 1100 nm	–	–	0.5	%

Range statedBlocking applies from 400 to 1100 nm, outside CWL ± 12 nm
Typical split from limitOD5 became a limit of 5 and a typical value of 6
Condition addedThe test dynamic range of 6.5 OD is stated
Section addedRear surface reflectance of the AR coating added

Reason. OD5 had no wavelength range and no test limit. Readings above the test range are reported as greater than 6.5 OD instead of as a number the setup cannot measure.

Transmission curve

Superseded

Transmission curve

One raster curve

Current

Fig. 1 Typical transmission: passband on a linear scale, blocking as optical density from 400 to 1100 nm. A model curve of the NB series, not a measurement of one filter.

Fig. 2 CWL against angle of incidence for n_eff 1.9, 2.0 and 2.1.

Fig. 3 CWL against temperature at +4 and +6 pm/K, through 532.0 nm at 23 °C.

Curve addedThree curves drawn from code replace the one raster curve
Tolerance note addedFigure 1 is labeled a model curve of the NB series, not a measurement of one filter

Reason. Curves drawn from code stay sharp at any zoom and are regenerated when a parameter changes. Each one shows a quantity the table only states at a point.

Footer and test policy

Superseded

Footer	~~Specifications subject to change.~~

Current

Test policy

Every unit: CWL, FWHM and peak transmission at AOI 0°, 23 °C, with the results supplied with the filter.
A sample from each coating lot: blocking from 400 to 1100 nm, and humidity and temperature cycling to MIL-STD-810 style methods (tested to, not certified), with no measurable CWL shift after 24 h at 60 °C and 85 % RH.
Typical values and curves are not tested per unit.

Revision history

Rev	Date	Description
Superseded	2026-06-12	Initial release: four values and one curve
Current	2026-10-24	Test conditions added to every specification; typical values separated from limits; blocking stated outside CWL ± 12 nm; three curves drawn from code; tolerance notes, test policy, part number key, outline and handling notes added

Section addedTest policy added: what is tested on every unit and on each coating lot
Section addedRevision history added
Wording changedThe subject to change line was replaced by the policy and the history

Reason. A limit and a typical value mean different things to a buyer; the policy says which numbers are measured on the unit in hand.

Document number and dates

Superseded

Document	~~NB-DS-532-3-B, Rev A~~

Current

Document

NB-DS-532-3-B Rev B, 2026-10-24, replaces Rev A of 2026-06-12.

Wording changedThe date and the revision it replaces are printed with the number

Reason. A copy on a desk states which revision it is and which one it supersedes.

Added in Rev B

Part number key

Superseded

Not in Rev A

Current

Part number	Size	Mount	Clear aperture	CWL, nm	FWHM, nm
NB-532-3-A	A	12.5 mm	9.0 mm	531.0 to 533.0	2.6 to 3.4
NB-532-3-B	B	25.0 mm	21.0 mm	531.0 to 533.0	2.6 to 3.4
NB-532-3-C	C	50.0 mm	45.0 mm	530.5 to 533.5	2.5 to 3.5

Key

NB series, 532 nm CWL (options 405, 450, 488, 532, 561, 633, 780, 808, 852, 980, 1064), 3 nm nominal FWHM (1, 3 or 10), size B.

Section addedSizes, clear apertures and limits for each part number

Reason. A part number decodes into its size, clear aperture and limits without a call to the supplier.

Absolute maximum ratings

Superseded

Not in Rev A

Current

Parameter	Conditions	Min	Typ	Max	Unit
Operating temperature	filter in its mount	−20	–	+70	°C
Storage temperature		−40	–	+85	°C

Section addedOperating and storage temperature stated separately

Reason. The operating range applies with the filter in its mount, and the storage range is wider.

Angle of incidence and effective index

Superseded

Not in Rev A

Current

Parameter	Conditions	Min	Typ	Max	Unit
Effective index, n_eff	average of s and p, fitted at 10° and 20°	1.9	2.0	2.1	–
CWL shift at 10° AOI	typical, from n_eff = 2.0, Eq. (1)	–	−2.0	–	nm

Eq. (1)

\displaystyle \lambda(\theta) = \lambda_0\sqrt{1-(\sin\theta/n_\mathrm{eff})^2}

Shift against angle

529.99 nm at 10° (−2.01 nm, 67 % of the bandwidth). Other angles at n_eff 2.0: −0.51 nm at 5°, −7.84 nm at 20°, −34.36 nm at 45°. At 10°, n_eff 1.9 gives −2.23 nm and 2.1 gives −1.82 nm.

Tilt tuning

A filter at 533.0 nm at AOI 0° reaches 532.0 nm at 7.0° (6.7° to 7.4° for n_eff 1.9 to 2.1). A filter at 531.0 nm cannot be tuned up.

Converging beam

In an f/2 beam (half angle 14.04°) the pupil-averaged shift is −2.00 nm at normal incidence and −3.93 nm at 10°, and the passband broadens.

Calculate the shift for your filter

Section addedEffective index, Eq. (1) and the shift at 10° added
Range statedn_eff limits of 1.9 to 2.1 bound the shift at any angle
Tolerance note addedTilt tuning and the f/2 beam described

Reason. A narrow passband leaves a laser line with a few degrees of tilt. Eq. (1) and n_eff give the shift before the filter is ordered.

Temperature coefficient

Superseded

Not in Rev A

Current

Parameter	Conditions	Min	Typ	Max	Unit
CWL temperature coefficient	23 to 70 °C, AOI 0°	–	+4	+6	pm/K

Figure 3 plots CWL against temperature at +4 and +6 pm/K through 532.0 nm at 23 °C.

Section addedTemperature coefficient added with typical and maximum values
Curve addedFigure 3 shows CWL against temperature

Reason. Temperature adds to the CWL limit. The coefficient lets a buyer compute the window for an operating range.

Damage threshold

Superseded

Not in Rev A

Current

Parameter	Conditions	Min	Typ	Max	Unit
Damage threshold, pulsed	532 nm, 10 ns, 20 Hz	–	0.5	–	J/cm²
Damage threshold, CW	532 nm, continuous wave	–	1	–	kW/cm²

Section addedPulsed and continuous-wave thresholds added
Condition addedWavelength, pulse length and repetition rate stated

Reason. A threshold without a pulse length or a repetition rate cannot be compared with a laser.

Polarization

Superseded

Not in Rev A

Current

Polarization note

Limits apply to unpolarized light at AOI 0°. In a representative three-cavity coating the s and p centers differ by 0.07 nm at 20° and 1.6 nm at 45°; ask for s and p curves above 20°.

Tolerance note addedLimits tied to unpolarized light; s and p split quantified

Reason. At larger angles the s and p centers separate, and the note says where to ask for separate curves.

Mechanical outline

Superseded

Not in Rev A

Current

Parameter	Value
Mounted outside diameter	25.0 +0/−0.1 mm
Thickness	5.0 ±0.1 mm
Clear aperture	21.0 mm min
Substrate	UV fused silica, 22.0 × 2.0 mm reference
Transmitted wavefront	λ/4 at 633 nm max
Wedge	3 arcmin max
Surface quality	60-40
Coating	Ion-beam-sputtered Nb₂O₅/SiO₂ on one substrate
Mount	Black anodized aluminum ring, arrow engraved
Drawing	NB-25-B-OD-001 Rev A

Section addedOutline dimensions, tolerances, substrate and mount added

Reason. A mating part can be designed from the sheet, and the drawing number points to the detail.

Handling

Superseded

Not in Rev A

Current

The arrow points in the direction of transmission.
The coated face on the lip side faces the source.
Clamp on the ring only; maximum retaining ring torque 0.15 N·m.
Clean with spectroscopic-grade alcohol on lens tissue; no ultrasonic bath.
Store dry, −40 to +85 °C.

Section addedOrientation, clamping, cleaning and storage notes added

Reason. Orientation, clamping and cleaning decide how the filter performs after delivery, so they travel with the sheet.

Sample files

Sespe Optics and the NB-532-3-B filter are fictional. The numbers are a worked example, not a product.

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