Jezdan Gomez

EUV Insight: thin-film design in the browser

I built EUV Insight for optics engineers designing EUV thin films and multilayer optics. It calculates transmission, reflectance and absorption for a layer stack, so you can compare material and thickness choices.

euvinsight.com
EUV Insight workspace showing a multilayer stack and its calculated reflectance spectrum
EUV Insight: a multilayer stack and its calculated reflectance spectrum.
R peak
73.80%
Peak wavelength
13.49nm
Bandwidth (FWHM)
0.622nm
Total thickness
278.5nm

From the results panel in the screenshot above.

From a layer stack to its optical response

  • λ 13.5 nmRuSiMo×40Si substrated 6.9 nmΓ 0.4 · NOT TO SCALE

    Build a filter or multilayer

    Choose materials and set their thickness, density and interface roughness. For periodic mirrors, set the number of bilayers, period and absorber fraction.

  • requirementenvelopeRλ

    Examine thickness tolerances

    Model independent thickness scatter, shared deposition errors and drift. Monte Carlo runs show a spectrum envelope and a simulated pass rate against the requirements you enter.

  • currentpinnedCSVSVGPNGPDF

    Compare and export

    Keep earlier designs on the plot while changing the current stack. Export spectra as CSV, figures as SVG or PNG, and a PDF report with the plot, metrics and layer stack. Availability depends on the app’s plan.

The stack in the screenshot: a Ru cap on 40 Mo/Si bilayers, 6.9 nm period, on a Si substrate.

See how the response changes with angle

A wavelength-by-angle map shows where the reflection band moves as the incidence angle changes. You can display reflectance, transmission or absorption and read a value at a chosen wavelength and angle.

Calculated reflectivity across wavelength and angle of incidence in EUV Insight.
λ 13.49 nmθ 0.0°
Calculated reflectivity across wavelength and angle of incidence in EUV Insight.

The model behind the plots

EUV Insight uses CXRO reference optical constants and a Parratt multilayer calculation, with a Névot–Croce approximation for interface roughness. The results depend on the material data and model assumptions. They are calculated spectra, not measurements of a fabricated coating.

The app’s methods pages describe the calculations, reference data and limitations.

Read the calculation methods (opens in a new tab)

Optical constants
CXRO reference data
Multilayer calculation
Parratt
Interface roughness
Névot–Croce approximation

Need a calculation tool for your products?

Send the design question, the inputs your customers have and the product data available. I’ll review the scope for a browser tool they can use on your website.